FEI Titan G2 80-200 CREWLEY

András Kovács, Roland Schierholz, Karsten Tillmann

Abstract


The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below.


References


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Cite article as: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) et al. (2016). FEI Titan G2 80-200 CREWLEY. Journal of large-scale research facilities, 2, A43. http://dx.doi.org/10.17815/jlsrf-2-68




DOI: http://dx.doi.org/10.17815/jlsrf-2-68

URN: http://nbn-resolving.de/urn:nbn:de:0001-jlsrf-2-68-9

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