FEI Tecnai G2 F20

Martina Luysberg, Marc Heggen, Karsten Tillmann

Abstract


The FEI Titan Tecnai G2 F20 is a versatile transmission electron microscope which is equipped with a Gatan Tridiem 863P post column image filter (GIF) and a high angle energy dispersive X-ray (EDX) detector. This set up allows for a variety of experiments such as conventional imaging and diffraction, recording of bright- and dark-field scanning transmission electron microscopy (STEM) images, or acquiring elemental maps extracted from energy electron loss spectra (EELS) or EDX signals.

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Cite article as: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (2016). FEI Tecnai G2 F20. Journal of large-scale research facilities, 2, A77. http://dx.doi.org/10.17815/jlsrf-2-138




DOI: http://dx.doi.org/10.17815/jlsrf-2-138

URN: http://nbn-resolving.de/urn:nbn:de:0001-jlsrf-2-138-7

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