DESY NanoLab
DOI:
https://doi.org/10.17815/jlsrf-2-140Abstract
The DESY NanoLab is a facility providing access to nano-characterization, nano-structuring and nano-synthesis techniques which are complementary to the advanced X-ray techniques available at DESY’s light sources. It comprises state-of-the art scanning probe microscopy and focused ion beam manufacturing, as well as surface sensitive spectroscopy techniques for chemical analysis. Specialized laboratory x-ray diffraction setups are available for a successful sample pre-characterization before the precious synchrotron beamtimes. Future upgrades will include as well characterization of magnetic properties.
References
Hoppe, R., Reinhardt, J., Hofmann, G., Patommel, J., Grunwaldt, J.-D., Damsgaard, C. D., . . . Schroer, C. G. (2013). High-resolution chemical imaging of gold nanoparticles using hard X-ray ptychography. Applied Physics Letters, 102(20). http://dx.doi.org/10.1063/1.4807020
Lohmeier, M., & Vlieg, E. (1993). Angle calculations for a six-circle surface X-ray diffractometer. Journal of Applied Crystallography, 26(5), 706–716. http://dx.doi.org/10.1107/S0021889893004868
Pfeifer, M. A., Williams, G. J., Vartanyants, I. A., Harder, R., & Robinson, I. K. (2006). Three-dimensional mapping of a deformation field inside a nanocrystal. Nature, 442, 63-66. http://dx.doi.org/10.1038/nature04867
Vlieg, E. (2000). ROD: a program for surface X-ray crystallography. Journal of Applied Crystallography, 33(2), 401–405. http://dx.doi.org/10.1107/S0021889899013655
Cite article as: Deutsches Elektronen Synchrotron (DESY). (2016). DESY NanoLab. Journal of large-scale research facilities,2, A76. http://dx.doi.org/10.17815/jlsrf-2-140
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