FEI Titan G2 80-200 CREWLEY


  • András Kovács
  • Roland Schierholz
  • Karsten Tillmann Ernst Ruska-Centre (ER-C) Jülich Research Centre 52425 Jülich Germany




The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below.


Du, H., Jia, C.-L., Mayer, J., Barthel, J., Lenser, C., & Dittmann, R. (2015). Atomic Structure of Antiphase Nanodomains in Fe-Doped SrTiO3 Films. Advanced Functional Materials, 25(40), 6369-6373. http://dx.doi.org/10.1002/adfm.201500852

Gan, L., Cui, C., Heggen, M., Dionigi, F., Rudi, S., & Strasser, P. (2014). Element-specific anisotropic growth of shaped platinum alloy nanocrystals. Science, 346(6216), 1502-1506. http://dx.doi.org/10.1126/science.1261212

Cite article as: Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) et al. (2016). FEI Titan G2 80-200 CREWLEY. Journal of large-scale research facilities, 2, A43. http://dx.doi.org/10.17815/jlsrf-2-68