The UE49 SGM RICXS beamline at BESSY II

Authors

  • Annette Pietzsch Helmholtz-Zentrum Berlin für Materialien und Energie http://orcid.org/0000-0001-6964-7425
  • Stefan Eisebitt Technische Universität Berlin und Helmholtz-Zentrum Berlin für Materialien und Energie Present Address: Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie im Forschungsverbund Berlin e.V

DOI:

https://doi.org/10.17815/jlsrf-2-78

Abstract

Beamline UE49-SGM is a dedicated high-flux soft x-ray beamline, spanning the energy range of 95 eV to 1400 eV. Its micrometer focus makes it ideally suitable for investigation of small or inhomogeneous samples both with spectroscopic methods and coherent scattering as well as imaging techniques with full polarization control.

References

Helmholtz-Zentrum Berlin für Materialien und Energie. (2016). CXS: Coherent X-ray Scattering at the UE49-SGM at BESSY II. Journal of large-scale research facilities, 2, A56, http://dx.doi.org/10.17815/jlsrf-2-81

Helmholtz-Zentrum Berlin für Materialien und Energie. (2016). The µmRIXS spectrometer at BESSY II. Journal of large-scale research facilities, 2, A55, http://dx.doi.org/10.17815/jlsrf-2-80

Könnecke, R., Follath, R., Pontius, N., Schlappa, J., Eggenstein, F., Zeschke, T., . . . Föhlisch, A. (2013). The confocal plane grating spectrometer at BESSY II. Journal of Electron Spectroscopy and Related Phenomena, 188, 133 - 139. http://dx.doi.org/10.1016/j.elspec.2012.11.003


Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2016). The UE49 SGM RICXS beamline at BESSY II. Journal of large-scale research facilities, 2, A54. http://dx.doi.org/10.17815/jlsrf-2-78

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Published

2016-03-03

Issue

Vol. 2 (2016)

Section

Articles

URN

http://nbn-resolving.de/urn:nbn:de:0001-jlsrf-2-78-4

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Copyright (c) 2016 Journal of large-scale research facilities JLSRF

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