The μmRIXS spectrometer at BESSY II

Authors

DOI:

https://doi.org/10.17815/jlsrf-2-80

Abstract

The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.

References

Könnecke, R., Follath, R., Pontius, N., Schlappa, J., Eggenstein, F., Zeschke, T., . . . Föhlisch, A. (2013). The confocal plane grating spectrometer at BESSY II. Journal of Electron Spectroscopy and Related Phenomena, 188, 133 - 139. http://dx.doi.org/10.1016/j.elspec.2012.11.003


Cite article as: Helmholtz-Zentrum Berlin für Materialien und Energie. (2016). The mmRIXS spectrometer at BESSY II. Journal of large-scale research facilities, 2, A55. http://dx.doi.org/10.17815/jlsrf-2-80

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Published

2016-03-04

Issue

Vol. 2 (2016)

Section

Articles

URN

http://nbn-resolving.de/urn:nbn:de:0001-jlsrf-2-80-9

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Copyright (c) 2016 Journal of large-scale research facilities JLSRF

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